Pragmatics Technologies, Inc.

TSE provides production proven, high performance parallel test interfaces for FLASH, DRAM and MCP applications.

There are two main categories of parallel production test interfaces:

• One-Piece Dedicated Interface
• Two-Piece Interfaces (Universal Interface)

One-Piece Dedicated Interfaces

Supported Handlers

Advantest Delta Design Hitachi Mirae Synax TechWing Custom Handlers

Two-Piece Production Test Interfaces

Large semiconductor test facilities have migrated from traditional one-piece to two-piece universal final test interfaces:

Cost Reduction

• Only pay for coax and labor once per test head
• Low cost depopulated top boards available for engineering

Engineering to Production Compatibility

• A top board can be populated with only two, four or eight sites for manual test engineering and thermal characterization or small lot qualification with the handler.
• If the device moves into HVM, an electrically compatible, fully populated top board can be provided in two weeks.

Reduce turn-around time for new device qualification

• Top Board turn around time is only two weeks for repeat order
• One piece interface turn around time is typically four weeks

Two-Piece Interfaces

TSE provides two different types of base boards for two-piece universal interfaces:
	ZIF Connector Type High density base board to top board interconnect Typically used for FLASH test applications
	C-Probe Type High performance base board to top board interconnect Typically used for high speed DRAM test applications

Applications and Benefits

Applicable Testers Advantest: T5581, T5365, T5585, T5371, T5375 Nextest: Maverick & Magnum Tanisys: M500 & M550 Verigy: V5500, HSM3600 Benefits Reduce Lead time Base Board : 4 weeks Top Board : 2 weeks Reduce cost of test

C-Probe Type Two-Piece Interface

Base Board Assembly

Top Board Assembly

Top Board Mounted on Base Board

C-Probes

C-Probe Block Assembly

Socket Guide

Socket Board

Connector Type Two-Piece Interface

T5375 Base Board Assembly

T5375 Top Board Assembly

Cold Test Option

Top Board Assembly